Lecture 1 - Introduction to the course
Lecture 2 - History from electrons to field ionisation to field evaporation
Lecture 3 - Filed Ion Microscopy
Lecture 4 - Basic physics behind Field Ionisation
Lecture 5 - Field Ion Microscopy Instrumentation
Lecture 6 - Field Ionisation to Field Evaporation
Lecture 7 - Field Desorption Microscopy
Lecture 8 - Atom Probe Tomography: Variables
Lecture 9 - Instrumentation
Lecture 10 - Pulsing methods
Lecture 11 - Photon-assisted Ionisation
Lecture 12 - Experimental protocols for APT
Lecture 13 - Experimental protocols for APT
Lecture 14 - Experimental protocols for APT
Lecture 15 - Tomographic Reconstruction
Lecture 16 - Tomographic Reconstruction
Lecture 17 - Tomographic Reconstruction
Lecture 18 - Calibration of reconstruction
Lecture 19 - Common artifacts in reconstruction
Lecture 20 - Spatial resolution in reconstruction
Lecture 21 - Electropolishing
Lecture 22 - Focused Ion Beam (FIB)
Lecture 23 - Focused Ion Beam (FIB)
Lecture 24 - Focused Ion Beam (FIB)
Lecture 25 - Data analysis
Lecture 26 - Quality of data
Lecture 27 - Mounting of specimens
Lecture 28 - Ion milling of specimens
Lecture 29 - Data analysis
Lecture 30 - Specimen loading
Lecture 31 - Data acquisition
Lecture 32 - Data analysis
Lecture 33 - Basics
Lecture 34 - Basics
Lecture 35 - Basics
Lecture 36 - Electron specimen interaction
Lecture 37 - TEM column cross-section
Lecture 38 - Electron Diffraction
Lecture 39 - Diffraction Patterns
Lecture 40 - Imaging
Lecture 41 - Defect analysis
Lecture 42 - Image Formation
Lecture 43 - Detection of electrons and ECCI
Lecture 44 - Application to Materials Science
Lecture 45 - Application to Materials Science
Lecture 46 - Application to Materials Science
